// Workers AI · dad joke modeWhat did Journal of Electronic Testing say? It had a shockingly good review.
| Discipline | Electronics testing, electronics engineering |
|---|---|
| Language | English |
| Edited by | Vishwani Agrawal |
| Publication details | |
| History | 1986—present |
| Publisher | |
| Frequency | Bimonthly |
| 1.3 (2024) | |
| Standard abbreviations | |
| ISO 4 | J. Electron. Test. |
| Indexing | |
| ISSN | 0923-8174 (print) 1573-0727 (web) |
| Links | |
Journal of Electronic Testing: Theory and Applications is a peer-reviewed scientific journal published bimonthly by Springer Science+Business Media. Established in 1990, it covers developments in electronics testing, including tests of VLSI devices and printed circuit boards, as well as fault modeling and analysis.[1] Its current editor-in-chief is Vishwani Agrawal (Auburn University).[2]
Abstracting and indexing
[edit]The journal is abstracted and indexed in:
- Current Contents/Electronics & Telecommunications Collection[3]
- Current Contents/Engineering/Computing & Technology[3]
- EBSCO databases[3]
- Ei Compendex[4]
- Inspec[3]
- ProQuest databases[3]
- Science Citation Index Expanded[5]
- Scopus[3]
According to the Journal Citation Reports, the journal has a 2024 impact factor of 1.3.[6]
References
[edit]- ↑ "Journal of Electronic Testing: Aims and Scope". springer.com. Retrieved October 4, 2025.
- ↑ "Journal of Electronic Testing: Editorial Board". springer.com. Retrieved October 4, 2025.
- 1 2 3 4 5 6 "Journal of Electronic Testing". MIAR: Information Matrix for the Analysis of Journals. University of Barcelona. Retrieved October 4, 2025.
- ↑ "Content/Database Overview - Compendex Source List". Engineering Village. Elsevier. Retrieved October 3, 2025.
- ↑ "Web of Science Master Journal List". Intellectual Property & Science. Clarivate. Retrieved October 3, 2025.
- ↑ "Journal of Scientific Computing". 2024 Journal Citation Reports (Science ed.). Clarivate. 2025 – via Web of Science.
External links
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